New Labthink Monocrystal Line Silicon Thickness Tester

Jinan, China, May 14, 2009 --(PR.com)-- Labthink introduces Labthink new PARAM CHY series of Thickness Testers for monocrystal line silicon thickness testing.

With the development of silicon technology, better quality silicon ingot and wafer are more reliable and profitable. Therefore, there have been great demands for silicon quality control worldwide. Labthink Instruemnts Co. Ltd. introduces PARAM CHY series of Thickness Testers to meet the needs.

The accuracy of Labthink monocrystal line silicon wafer thickness testers can reach 0.1um. These testers are high accuracy and high efficiency. Furthermore, CHY-CA is equipped with automatic sample feeding for constant testing requirements.

Labthink PARAM Thickness Testers for silicon wafer thickness testing consist of control, measurement and output systems. Measurement system measures thickness of silicon wafer and outputs corresponding electronic signal; control system is for parameter setting, modification, signal transfer and results display; output system calculates and prints the testing results.

These testers apply the most advanced measurement achievements, and are fully guaranteed with high accuracy and high result similarity. They are easy to operate and reduce human interferences to the utmost. Contact area, pressure, speed and other items comply with relevant standards.

Labthink, the excellent provider of testing instruments and testing services, is devoted to provide most excellent and complete quality control solutions for pharmaceutical, foodstuff, cosmetics, packaging, printing, adhesive, automotive, petrochemistry, environment, biology, new energy, construction, aviation and electronic industries worldwide.

Labthink Instruments Co., Ltd.
No. 144 Wuyingshan Road, Jinan 250031, China
Tracy Bao info@labthink.cn
Tel: 0086 531 85061153 fax:0086 531 85812140

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