Bruker Wins Over $7 Million in SP9900+ 3D Optical Microscope Orders
Instrument Breaks the Throughput Barrier for HDI Substrate Metrology - December 07, 2012
Bruker Introduces Proprietary IRIS TERS Probes
High-Contrast, Proven TERS Probe Tips for Complete Innova-IRIS TERS Solution - December 01, 2012
PeakForce Tapping Gains Rapid Adoption as Revolutionary AFM Mode
Over 100 Research Citations in 3 Years - December 01, 2012
Bruker Advances Universal Mechanical Tester (UMT) Design
New UMT Increases Flexibility and Seamlessly Integrates Optical Profiling and Mechanical Testing - December 01, 2012
Bruker Releases AFM Zoom Option for 3D Optical Microscopes
NanoLens™ Accessory Expands Power of ContourGT Systems - December 01, 2012
Bruker Wins Over $3 Million in Orders for Consumer Display Solution
Multi-System ContourGT-X Delivery Meets Ramping Demand - November 10, 2012
Bruker Releases New Benchmark 3D Optical Microscope System
Bruker's ContourGT-I is First Bench Top with Tip/Tilt Head and Vibration Tolerant Design - October 18, 2012
NSG Group Selects Bruker Dimension Icon Atomic Force Microscope
New Levels of AFM Ease of Use and Productivity Accelerate Next-Generation Product Development - September 26, 2012
Bruker Introduces New AFM Tools for Life Science Research
*Nanomechanics Package Expands Applications in Mechanobiology - September 22, 2012
Semiconductor Leader Purchases Multiple Bruker 3D Optical Microscopes
*ContourGT-X Analyzes Critical Yield Issues in Copper-based Processes in Semiconductor Packaging. - September 03, 2012
Bruker Introduces New Nanoelectrical AFM Mode
PeakForce KPFM Enables Quantitative Nanoscale Surface Potential Measurements - August 15, 2012
Bruker Announces Dimension FastScan Bio AFM for Biological Dynamics
First Commercial Bio-AFM to Capture High-Resolution Dynamics with Ease - August 03, 2012
Bruker Announces Three Next-Generation Semiconductor Metrology Products
New AFM and X-Ray Systems Enable Industry Transition to Larger, 450mm Wafer Production - July 14, 2012
Bruker Introduces EC-AFM Solutions for Li Battery Research
Dimension Icon Platform Enhancement Enables In Situ Studies of Battery Electrodes - June 22, 2012
Bruker Introduces Novel TERS-Ready AFM System
New Bruker Innova-IRIS System Delivers Highest AFM-Raman Performance - December 02, 2011
Bruker Completes Acquisition of Center for Tribology, Inc.
Bruker Corporation today announced the closing of its acquisition of Center for Tribology, Inc. (CETR) for $13 million in cash as an initial purchase price, with potential additional earn-out payments of up to $4 million in cash, depending on growth and profitability of the CETR-business within... - October 15, 2011
Bruker Announces Agreement to Acquire CETR
Bruker Nano Surfaces Division to Add Synergistic Tribology and Indenting Equipment Business - September 16, 2011
Alcon Selects Bruker ContourGT 3D Microscope for Intra-Ocular Lens R&D
ContourGT-X8 Non-Contact, Optical Surface Profiler Enables Rapid, Repeatable Nanoscale-Level Characterization of Intra-Ocular Lenses. - September 09, 2011
Bruker’s AcuityXR Receives R&D 100 Award for Technological Innovation
Enhanced Resolution Enables ContourGT 3D Optical Microscopes to Break Diffraction Limit - August 20, 2011
Bruker Introduces Dimension Edge PSS Atomic Force Microscope for Advanced HB-LED Production Metrology
The Dimension Edge PSS is an easy-to-operate AFM that delivers resolution far beyond traditional optical techniques while at the same time providing precise 3D profile information to control the most advanced PSS processes. - August 17, 2011
Bruker Announces Fast Scanning for the MultiMode Atomic Force Microscope
Fast Scanning Technology Now Available on the MultiMode 8 AFM - July 21, 2011
Bruker Demonstrates NPFLEX-LA at SAE 2011 World Congress
Patent-Pending, Comprehensive Surface Metrology Solution Enables Transportation Industry to Better Comply with Environmental Regulations and Reduce Warranty Costs. - April 14, 2011