New Zebra OptoProfiler Tool for Patterned Solar CellBow, Warp, Full Surface Topography and Full Stress Tensor Characterization from Sunrise Optical LLC

Sunrise, FL, April 15, 2008 --(PR.com)-- Zebra OptoProfiler is capable of measuring rough structured, painted, and diffuse reflective surfaces commonly encountered in solar cell manufacturing. It has capability to measure your solar cells at virtually every step of the manufacturing process. Range of bow measured exceeds 10 mm, and does not depend on wafer diameter, while providing accuracy and reproducibility exceeding 10 sigma of typical multi-crystalline solar cell manufacturing process window.

Tool has capability to calculate variety of wafer topography parameters such as bow and warp. The stress tensor calculation capability is also provided as optional software upgrade. The Data collected by Zebra OptoProfiler can be exported in raw point cloud format for display and analysis using popular third party stress and design packages.

Product Features - Measures wafers from 4-12 inch diameter- Easy user friendly interface, no special operator training required- Measures rough, weakly reflective surfaces- Provides output files in point cloud format

Product Availability - Sample measurement service is now available. Lead-time for tool is currently 4 to 8 weeks ARO.

About Sunrise Optical LLC - Sunrise Optical LLC is an optical metrology company located in Sunrise FL. It specializes in design and manufacturing of spectroscopic and imaging systems for three-dimensional (3D) image acquisition and development of new algorithms for three-dimensional (3D) image processing. Sunrise Optical LLC is serving the solar cell manufacturing, and thin film metrology markets. More information on Sunrise optical LLC can be found on company website www.zebraoptical.com.

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