New Robust End Point Detection System from Sunrise Optical LLC
Sunrise Optical LLC (Zebraoptical.com) announces the new End Point Detection (EPD) product family for the monitoring and control of the chemical processing of novel materials. - August 20, 2015
Sunrise Optical LLC: Zebraoptoprofiler Model X - the Long Optical Arm Commercial Scanner for Large Radii X-ray Mirrors and Wafer Stress Tensor Measurements
Sunrise Optical LLC: Zebra Optoprofiler Model X - a new improved metrology for the long radii of curvature X-ray, concentrating solar, and other photonics mirrors is now being offered. The tool, in the standard configuration, targets measurement of the 3D topography, and radii of curvature of X... - May 23, 2012
Joint Venture for All-Reflective, Diffraction Limited Microscope Objective
Sunrise Optical, LLC, and Neoteric Concepts, LLC, signed joint venture partnership to market, and to produce a high NA, broad-band, all-reflective, diffraction limited confocal microscope objective. - September 29, 2010
New Family of Surface Plate Accessories for Zebraoptical OptoProfiler for Bow, Warp for Large Crystalline Solar Cells, MEMs Substrates, and Other Devices
SOLLC: Sunrise Optical LLC provides now surface plates accessories for bow, warp for large crystalline solar cells, MEMs substrates and other devices. Sunrise Optical LLC has added line of surface plate accessories for Zebraoptical OptoProfiler for bow, warp for large crystalline solar cells, MEMs... - January 23, 2010
ZebraOptical OptoProfiler for Bow, Warp, Roller Wave Glass, and Edge Kink Metrology for Tempered Glass, Thin Film Solar Cells, and Other Devices
SOLLC: Zebra OptoProfiler Glass Metrology Tool for full surface tempered glass measurements including roller wave, and edge kink, and full surface metrology for thin film solar cells manufacturing. Same technology in scaled down version is offered for glass MEMs substrates. - January 06, 2010
ZebraOptical CT-IR an Interferometric Probe for Substrate Thickness, Topography, Trench Depth, Membrane Thickness and Other Applications from Sunrise Optical LLC
Sunrise Optical LLC has added a new Interferometric Probe Option to Zebra OptoProfiler (CT-IR) for substrate topography, and thickness metrology. Zebra CT-IR option uses infrared (IR) interferometric technique, which provides accurate substrate thickness measurement and thickness variation (TTV) of... - December 18, 2009
Zebraoptical OptoProfiler Bow, Warp, Roller Wave Glass Metrology for Thin Film Solar Cells
Sunrise Optical LLC has added a new Glass Option to Zebra OptoProfiler product family for thin film solar cell manufacturing. - August 02, 2008
New Zebra OptoProfiler Tool for Patterned Solar CellBow, Warp, Full Surface Topography and Full Stress Tensor Characterization from Sunrise Optical LLC
A Solar Cell Metrology Tool Manufacturer has added a new 3rd generation Zebra OptoProfiler G3 to its product and services family. The Zebra OptoProfiler is a user-friendly solution for solar cell topography and stress measurements. - April 15, 2008